Ключевые слова: HTS, Bi2223/Ag, tapes, doping effect, microstructure, sintering, fabrication, melting, susceptibility, temperature dependence, X-ray diffraction, critical current density
Ключевые слова: HTS, Bi2223/Ag, tapes, doping effect, comparison, fabrication, PIT process, susceptibility, phase composition
Ключевые слова: HTS, Bi2223/Ag, tapes, sintering, fabrication, microstructure
Ключевые слова: patents, HTS, coated conductors, buffer layers, fabrication, doping effect, YBCO, substrate Ni-W, MOD process
Ключевые слова: patents, HTS, coated conductors, fabrication, reel-to-reel process, buffer layers, long conductors, multilayered structures
Ключевые слова: HTS, Bi2223/Ag, tapes, fabrication, pressure effect, sintering, microstructure, grain alignment, critical caracteristics, critical current density
Schmidt W., Schoop U., Malozemoff A.P., Otto A., Verebelyi D., Neumueller H., Kraemer H., Wohlfart M.
Ключевые слова: HTS, YBCO, coated conductors, FCL resistive, coils bifilar, stabilizing layers, prototype, test results, recovery characteristics, power equipment
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Buczek D., Lynch J., Verebelyi D.T., Aized D., Huang Y., King C., Carter W., Schreiber J., Prasova M., Tucker D., Harnois R.
Zhang W., Huang Y., Li X., Kodenkandath T., Rupich M.W., Schoop U., Verebelyi D.T., Thieme C.L., Siegal E., Holesinger T.G., Maiorov B., Civale L., Miller D.J., Maroni V.A., Li J., Martin P.M., Specht E.D., Goyal A., Paranthaman M.P.
Ключевые слова: HTS, YBCO, coated conductors, coils bifilar, FCL resistive, short circuit test, quench current, experimental results, power equipment
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Jia Q.X., Verebelyi D.T., Chen Z., Holesinger T.G., Larbalestier D.C., Civale L., Maroni V., Maroni V., Huang Y., Rane M.V., Rane M.V., Feldman D.M.
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Buczek D., Lynch J., Verebelyi D.T., Fleshler S., Huang Y., Carter W., Schreiber J., Prasova M., Tucker D.
Rupich M.W., Schoop U., Thieme C., Li X., Zhang W., Kodenkandath T., Nguyen N., Siegal E., Goyal A., Paranthaman M., Verebelyi D.T., Civale L., Maiorov B., Holesinger T.
Rupich M.W., Thieme C.L., Schoop U., Li X., Zhang W., Kodenkandath T., Goyal A., Verebelyi D.T., Paranthaman M.P., Sathyamurthy S., Bhuiyan M.S.
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Verebelyi D.T., Gouge M.J., Lue J.W., Demko J.A., Thieme C.L.H., Duckworth R.C., Caughman J., Tolbert J.
Ключевые слова: HTS, Bi2223, tapes, cables, substrate Ni-W, ac losses, inductance, YBCO, coated conductors, comparison, experimental results, numerical analysis, power equipment
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